Maximum Coverage Chase Decoder for Optical Interconnects

2026-06-09

AI Summary

This work addresses the high computational complexity of Chase decoding in optical interconnects by formulating test pattern selection as a generalized maximum coverage problem, thereby proposing a low-complexity Chase decoder. By innovatively incorporating maximum coverage optimization, the method effectively eliminates redundant test patterns while preserving the error-correction performance of conventional Chase decoding. Experimental results demonstrate significant reductions in the number of test patterns—25% for RS-BCH codes and 61.3% for oFEC codes—substantially lowering decoding overhead. This approach provides an efficient error-correction solution tailored for high-speed optical interconnect systems.

Abstract

We propose a low-complexity Chase decoder for optical interconnects that formulates test pattern selection as a generalized maximum coverage problem. For concatenated RS-BCH and oFEC codes, our decoder achieves the standard Chase decoding performance with 25% and 61.3% fewer test patterns, respectively.

Problem

• Chase decoder
• optical interconnects
• test pattern selection
• maximum coverage
• low-complexity decoding

Innovation

• Chase decoding
• maximum coverage
• optical interconnects
• test pattern selection
• low-complexity decoder