Blind Deconvolution of Binary and Pattern Images with Pixel Intensity Constraints and Sparse Gradient Prior

📅 2026-09-19
📈 Citations: 0
Influential: 0
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🤖 AI Summary
本文针对二值和图案图像的盲去卷积问题,提出了一种结合像素强度约束与梯度稀疏正则化的方法,实验表明该方法在视觉质量和量化指标上优于现有技术。
📝 Abstract
Blind image deconvolution (BID) is a prominent research topic in the field of imaging sciences, given its significant practical applications. Most existing model-based BID methods focus on natural images, incorporating appropriate prior knowledge about both the underlying image and the blur kernel. However, for certain classes of images, such as barcodes, text, and patterns, pixels can only take very limited values, a specific prior that is often overlooked in the literature. In this article, we introduce a novel pixel intensity constraint to leverage this important information, improving recovery performance for these specialized image classes. Specifically, we propose a unified framework for blind binary and pattern image deconvolution that incorporates both the pixel intensity constraint and a gradient sparsity regularizer. Numerical experiments demonstrate that our method outperforms many existing BID techniques, achieving superior results in terms of both visual quality and quantitative metrics.
Problem

Research questions and friction points this paper is trying to address.

Blind Image Deconvolution
Pixel Intensity Constraints
Sparse Gradient Prior
Binary Images
Pattern Images
Innovation

Methods, ideas, or system contributions that make the work stand out.

pixel intensity constraint
gradient sparsity
blind deconvolution
binary and pattern images
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Qinghua Zhang
Laboratory of Mathematics and Complex Systems (Ministry of Education of China), the School of Mathematical Sciences, Beijing Normal University, Beijing 100875, P. R. China
Xuesong Yang
Xuesong Yang
NVIDIA
Machine LearningDeep LearningNatural Language ProcessingSpeech Signal Processing
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Liangtian He
School of Mathematical Sciences, and Anhui University Center for Applied Mathematics, Anhui University, Hefei, 230601, P. R. China
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Liang-jian Deng
School of Mathematical Sciences, University of Electronic Science and Technology of China, Chengdu 611731, P. R. China
Jun Liu
Jun Liu
Key Laboratory for Applied Statistics of MOE, School of Mathematics and Statistics, Northeast Normal University, Changchun 130024, P. R. China