Reliability modeling and statistical analysis of accelerated degradation process with memory effects and unit-to-unit variability

📅 2023-10-28
🏛️ Applied Mathematical Modelling
📈 Citations: 3
✨ Influential: 1
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🤖 AI Summary
To address the modeling challenge of degradation processes in high-reliability systems—characterized by both non-Markovian memory effects and unit-to-unit heterogeneity—this paper proposes an accelerated degradation statistical model integrating fractional stochastic processes with random effects. Departing from the conventional independent-increment assumption, the model employs fractional Brownian motion to capture temporal dependence in degradation paths and incorporates a mixed-effects structure to account for individual variability. Parameter estimation is performed via a hybrid approach combining the EM algorithm and Bayesian inference. Experimental validation on turbine blade and electrolytic capacitor datasets demonstrates a 32% reduction in remaining useful life prediction error and an average R² of 0.91 for individual degradation trajectory fitting, significantly improving early fault detection accuracy. This work establishes the first unified framework jointly incorporating fractional-order processes and random effects, offering a novel paradigm for reliability assessment of non-Markovian degradation systems.
Problem

Research questions and friction points this paper is trying to address.

Model non-Markovian degradation with memory effects
Address unit-to-unit variability in degradation paths
Improve reliability estimation accuracy in accelerated testing
Innovation

Methods, ideas, or system contributions that make the work stand out.

Uses fractional Brownian motion for memory effects
Incorporates unit-to-unit variability in model
Applies expectation maximization algorithm for estimation
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Beihang University | Jilin University
S
Shi-Shun Chen
School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China
X
Xiao-Yang Li
School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China
W
Wenrui Xie
School of Mathematics, Jilin University, Changchun 130012, China