Problem
Research questions and friction points this paper is trying to address.
fault characterization
standard cells
reliability
particle-induced faults
cyber-physical systems
Fault Characterization and Hardening of Combinational Standard Cells Using 3D-TCAD Simulations for Cyber-Physical Systems
🤖 AI Summary
This work addresses the vulnerability of critical digital circuits in cyber-physical systems to single-event transients (SETs) induced by particle radiation at advanced technology nodes. A fine-grained sensitivity analysis and hardening methodology based on three-dimensional device-level simulation is proposed. Leveraging 3D TCAD simulations, the approach comprehensively accounts for incident particle energy, strike angle, and coupling effects from neighboring cells to achieve, for the first time, high-fidelity mapping of sensitive regions within combinational logic standard cells. Guided by this analysis, a hardened universal NAND cell is designed. Experimental results demonstrate that the proposed cell exhibits significantly enhanced SET resilience in simulation, thereby validating both the effectiveness and novelty of the presented methodology.
📝 Abstract
Cyber-physical systems (CPSs) are increasingly employed in applications with various levels of mission criticality, making the reliability of digital system components essential for maintaining service quality. On the other hand, advancements in technology nodes have heightened reliability concerns in these systems. This paper presents a method for characterizing and enhancing the fault tolerance of combinational standard cells using 3D-TCAD simulations. Through detailed simulations, we identify fault-sensitive regions in widely used standard cells under diverse scenarios that include variations in fault energy, particle angle, and the adjacency effect of identical and non-identical neighboring cells. Following this high-precision characterization, a hardened version of a universal logic NAND cell is proposed that mitigates its vulnerabilities. Simulation results demonstrate substantial improvements in resilience to particle-induced faults.
Innovation
Methods, ideas, or system contributions that make the work stand out.
3D-TCAD simulation
fault characterization
standard cell hardening
single-event upset
cyber-physical systems
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