Scholar

R. Joseph Kline

Google Scholar ID: DDdU-oIAAAAJ

National Institute of Standards and Technology

X-ray scattering of soft materials. Dimensional Metrology

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Citations & Impact

All-time

Citations

19,501

H-index

55

i10-index

106

Publications

20

Co-authors

13

Publications

1 items

Titanic overconfidence -- dark uncertainty can sink hybrid metrology for semiconductor manufacturing

2026

Cited

0