Scholar

xian tao

Google Scholar ID: DlrxyrgAAAAJ

Institute of Automation, Chinese Academy of Sciences

defect detectionmachine visiondeep learninganomaly detection

Citations & Impact

All-time

Citations

2,305

H-index

i10-index

Publications

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Contact

Resume

Academic Achievements

Published multiple high-impact papers in IEEE Transactions journals, including IEEE TII, IEEE TIM, and IEEE TAI
Paper [9] is an ESI Highly Cited Paper in IEEE Transactions on Systems, Man, and Cybernetics: Systems (IF: 13.451)
Several papers ranked in SCI Top 1% or Top 15%, e.g., IEEE TII (IF: 11.648)
Second-place solution in CVPR VISION 23 Challenge Track 1 – Data Efficient Defect Detection
Led or contributed to industrial vision inspection projects covering conductive particle detection, power line insulator defect recognition, and weak scratch inspection on optical elements