Scholar

Taeyong Jo

Google Scholar ID: HfFKeiQAAAAJ

Seoul National University

metrology semiconductor ocd ellipsometry

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Citations & Impact

All-time

Citations

181

H-index

7

i10-index

6

Publications

20

Co-authors

21

list available

Publications

1 items

Uncertainty Estimation via Hyperspherical Confidence Mapping

2026

Cited

0

Co-authors

2 total

Associate Professor, KAIST