Scholar
Subed Lamichhane
Google Scholar ID: OAOdblkAAAAJ
VLSI Systems and Computation Laboratory, University of California, Riverside
Artificial Intelligence
VLSI Reliability
VLSI CAD
VLSI EDA
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Citations & Impact
All-time
Citations
41
H-index
3
i10-index
2
Publications
13
Co-authors
6
list available
Publications
1 items
BPINN-EM-Post: Stochastic Electromigration Damage Analysis in the Post-Void Phase based on Bayesian Physics-Informed Neural Network
2025
Cited
0
Co-authors
3 total
Sheldon X.-D. Tan
University of California at Riverside
Haotian Lu
PhD student at UC Riverside
Liang Chen
Shanghai University
