Scholar
Michel Bosman
Google Scholar ID: dHrnkpEAAAAJ
National University of Singapore
Scanning Transmission Electron Microscopy
Nanoplasmonics
2D materials
Microelectronics
Electron Spectroscopy
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Citations
10,801
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146
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20
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0
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Publications
1 items
Context-Aware Deep Learning for Defect Classification in Atomic-Resolution STEM
2026
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Resume (English only)
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Co-authors: 0 (list not available)
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