Scholar
Eunha Lee
Google Scholar ID: nXM39mIAAAAJ
SAIT (Samsung Advanced Institute of Technology), Samsung Electronics
Microscopy & spectroscopy
electron tomography
2D material
high-k dielectric
oxide TFT
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Citations & Impact
All-time
Citations
11,120
H-index
41
i10-index
75
Publications
20
Co-authors
0
Publications
2 items
From Voting to Agent Collaboration: Answer-Type-Aware LLM Pipelines for BioASQ 14b
2026
Cited
0
ATTNSOM: Learning Cross-Isoform Attention for Cytochrome P450 Site-of-Metabolism
2026
Cited
0
