Scholar
Maksim Jenihhin
Google Scholar ID: v3_CtPwAAAAJ
Dept. of Computer Systems, Tallinn University of Technology
nanoelectronics reliability
system dependability
verification and debug
fault tolerance and resilience
EDA methodologies
Follow
Google Scholar
↗
Citations & Impact
All-time
Citations
753
H-index
14
i10-index
22
Publications
20
Co-authors
30
list available
Publications
4 items
JASPER: Special Session on Joint Reliability And Security Assessment of SPlit Computing for Edge Robustness
2026
Cited
0
SENTRY: Statistical Reliability Analysis of Vision Transformers Under Soft Errors
2026
Cited
0
SPARQ: Spiking Early-Exit Neural Networks for Energy-Efficient Edge AI
2026
Cited
0
FORTALESA: Fault-Tolerant Reconfigurable Systolic Array for DNN Inference
2025
Cited
0
Co-authors
5 total
Jaan Raik
Tallinn University of Technology
Artur Jutman
TalTech
Franco Fummi
Professor of Computer Engineering, Universita' di Verona
Uljana Reinsalu
researcher at Tallinn University of Technology
Goerschwin Fey
Hamburg University of Technology
